量測設備銷售 / Thermawave
Opti-Probe 3290I
產品介紹：
Equipment description:
‧Purpose: Thin Film Measurement System, to monitor film thickness and optical characters (n & k).
‧Model: ThermawaveOP3290I
‧Original Manufacture Date: 2005
‧SN: 6990
System configuration:
‧Currently Configured for 200mm Wafer Size
‧Handler: 200mmSMIF Interface, ASYST Load Port x2
相關資訊：
N/A
